Tasks

   Main tasks solved by the spectrometer Escalab 250Xi:

1. Routine X-ray photoelectron spectroscopy (XPS) analysis of large areas. Wide scans and detailed analysis of core levels of specific elements. Binding energy resolution is  less than 0.4 eV.

2. XPS images with spatial resolution down to 3 microns. Small area XPS using the micro-focused X-ray source (spot size down to 120 microns, area size down to 20 microns).

3. Ion depth profiling and angle-resolved XPS studies to investigate the composition of the sample versus depth.

4. Ultraviolet photoelectron spectroscopy (UPS) using both He I (21.2 eV) and He II (40.8 eV) UV source. Other photon energies are possible  using other rare gases. Sample work function measurements.

5. Сompositional  and structure analysis of the topmost atomic layer of the surface using low energy ion scattering spectroscopy. Isotope analysis.

6. Surface imaging with the use of  scanning electron microscopy with spatial resolution from 0.1 to 3 microns. Measuring of spatially resolved Auger spectra, scanning Auger maps with distribution of investigated elements on the surface.

7. Determination  of energy of direct interband transitions, surface plasmons and density of unoccupied states using reflected electron energy loss spectroscopy            

8. Investigation of monocrystal structure of the sample surface by low-energy electron diffraction method.

   Main tasks solved by analytical module of X-ray and ultraviolet photoelectron spectroscopy of research modular platform Nanolab:

1. Study of electron energy structure of core levels and valence band using monochromatized radiation sources. Measurements of photoelectron spectra with angular and spin resolution. Study of the dispersion dependencies of the electronic states in a given direction of the Brillouin zone. Fermi Surface Mapping.

2. Growth of low-dimensional systems, including the use of effusion cells and electron beam evaporators.

3. Investigation of monocrystal structure of the sample surface by low-energy electron diffraction method. Symmetry and unit cell determination. Auger spectra measurements

   Main tasks solved by analytical module of scanning tunneling and atomic force microscopy of research modular platform Nanolab:

1. Study of the surface by scanning tunneling and atomic force microscopy with atomic resolution in UHV conditions. Investigation of sample surface morphology. Normal force/lateral force detection.

2. Study of the surface by scanning tunneling spectroscopy in UHV conditions. Determination of the work function, the local density of states and the band gap.

3. Growth of low-dimensional systems, including the use of effusion cells and electron beam evaporators.

4. Investigation of monocrystal structure of the sample surface by low-energy electron diffraction method. Symmetry and unit cell determination. Auger spectra measurements.